Link: https://www.sciencedirect.com/science/article/pii/S0167572910000841
Description: webJan 1, 2011 · KPFM measures a contact potential difference (CPD) between the sample surface and the tip. In high-resolution KPFM, CPD is strongly affected by a short-range … Author: Wilhelm Melitz, Jian Shen, Andrew C. Kummel, Sangyeob Lee Publish Year: 2011
Author: Wilhelm Melitz, Jian Shen, Andrew C. Kummel, Sangyeob LeePublish Year: 2011DA: 35 PA: 76 MOZ Rank: 51
Link: https://www.sciencedirect.com/science/article/pii/S0169433299005371
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DA: 24 PA: 100 MOZ Rank: 53
Link: https://www.parksystems.com/applications/electrical-electronics/semiconductor/720-how-to-obtain-sample-potential-data-for-kpfm-measurement
Description: webThe KPFM measures Contact Potential Difference (CPD) between a conducting AFM tip and a sample. The CPD (V CPD ) between the tip …
DA: 10 PA: 12 MOZ Rank: 23
Link: https://www.nist.gov/mml/mmsd/nanomechanical/kelvin-probe-force-microscopy-developments-and-applications
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DA: 51 PA: 48 MOZ Rank: 15
Link: https://www.nist.gov/mml/mmsd/nanomechanical/kelvin-probe-force-microscopy-developments-and-applications
Description: webMay 3, 2023 · Summary. Kelvin probe force microscopy (KPFM) is an atomic force microscopy (AFM) mode in which the contact potential difference (CPD) between a …
DA: 25 PA: 55 MOZ Rank: 70
Link: https://onlinelibrary.wiley.com/doi/pdf/10.1002/9783527699773.ch14
Description: webKelvin probe force microscope (KPFM), based on the Kelvin method, measures the contact potential difference (CPD) between a conducting atomic force microscopy (AFM) … Author: Yijun Xia, Bo Song Publish Year: 2017
Author: Yijun Xia, Bo SongPublish Year: 2017DA: 82 PA: 19 MOZ Rank: 8
Link: https://www.nature.com/articles/srep30557
Description: webAug 12, 2016 · As such, Kelvin probe force spectroscopy (KPFS) is often preferred for precise measurements of CPD 3. KPFS consists of applying … Author: Liam Collins, Alex Belianinov, Suhas Somnath, Nina Balke, Sergei V. Kalinin, Stephen Jesse Publish Year: 2016
Author: Liam Collins, Alex Belianinov, Suhas Somnath, Nina Balke, Sergei V. Kalinin, Stephen JessePublish Year: 2016DA: 12 PA: 50 MOZ Rank: 75
Link: https://www.boisestate.edu/wp-content/uploads/sites/551/2022/11/KPFM-SOP-Icon-1_0.pdf
Description: webAlthough KPFM is more complex to implement than EFM because it involves nulling the probe-sample surface potential difference (also known as the contact potential difference, …
DA: 29 PA: 58 MOZ Rank: 89
Link: https://link.springer.com/chapter/10.1007/978-3-319-75687-5_14
Description: webMar 10, 2018 · Abstract. The surface potential distribution measured using Kelvin probe force microscopy (KPFM) is influenced by the contact potential difference (CPD) …
DA: 76 PA: 94 MOZ Rank: 68
Link: https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6009372/
Description: webJun 15, 2018 · In this study, we compare the most commonly used amplitude modulation (AM) and frequency modulation (FM) Kelvin probe force microscopy (KPFM) methods …
DA: 78 PA: 21 MOZ Rank: 67
Link: https://www.nanosurf.com/images/applications/KPFM/Kelvin-probe-force-microscopy-KPFM.pdf
Description: webKelvin probe force microscopy (KPFM), also known as surface potential microscopy, is one member of a suite of electrical characterization methods available in atomic force …
DA: 35 PA: 75 MOZ Rank: 42